System-On-Chip: Next Generation Electronics

Autorentext
Bashir M Al-Hashimi is Professor of Computing Engineering at the School of Electronics and Computer Science, University of Southampton, UK.

Klappentext
This book highlights both the key achievements of electronic systems design targeting SoC implementation style, and the future challenges presented by the continuing scaling of CMOS technology.

Inhalt
Part 1: System-level design Chapter 1: Multi-criteria decision making in embedded system design Chapter 2: System-level performance analysis - the SymTA/S approach Chapter 3: Analysis and optimisation of heterogeneous real-time embedded systems Chapter 4: Hardware/software partitioning of operating systems: focus on deadlock avoidance Chapter 5: Models of computation in the design process Chapter 6: Architecture description languages for programmable embedded systems Part 2: Embedded software Chapter 7: Concurrent models of computation for embedded software Chapter 8: Retargetable compilers and architecture exploration for embedded processors Chapter 9: Software power optimisation Part 3: Power reduction and management Chapter 10: Power-efficient data management for dynamic applications Chapter 11: Low power system scheduling, synthesis and displays Chapter 12: Power minimisation techniques at the RT-level and below Chapter 13: Leakage power analysis and reduction for nano-scale circuits Part 4: Reconfigurable computing Chapter 14: Reconfigurable computing: architectures and design methods Part 5: Architectural synthesis Chapter 15: CAD tools for embedded analogue circuits in mixed-signal integrated Systems-on-Chip Chapter 16: Clock-less circuits and system synthesis Part 6: Network-on-chip Chapter 17: Network-on-chip architectures and design methods Chapter 18: Asynchronous on-chip networks Part 7: Simulation and verification Chapter 19: Covalidation of complex hardware/software systems Chapter 20: Hardware/software cosimulation from interface perspective Chapter 21: System-level validation using formal techniques Part 8: Manufacturing test Chapter 22: Efficient modular testing and test resource partitioning for core-based SoCs Chapter 23: On-chip test infrastructure design for optimal multi-site testing Chapter 24: High-resolution flash time-to-digital conversion and calibration for system-on-chip testing Chapter 25: Yield and reliability prediction for DSM circuits

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