Atom Probe Field Ion Microscopy

This work examines atom probe field ion microscopy. It includes discussion on physical principles of field ion microscopy, FIM image interpretation and application, physical principles of atom probe interpretation, statistical analysis of atom probe data and metallurgical applications.

For the practising analyst there are nine useful appendices including one on specimen preparation, and the book will be invaluable to researchers in the above fields.

Autorentext
Hetherington - deceased

Klappentext
A definitive account of the theory, practice, and applications of atom probe field ion microscopy (APFIM). The APFIM technique provides a unique method for observing and chemically identifying single atoms on solid surfaces. New applications for this technique are rapidly emerging and graduate level material and surface scientists will enjoy this account of the state-of-the-art.

Zusammenfassung
This book provides a definitive account of the theory, practice and applications of atom probe field ion microscopy (APFIM). The APFIM technique provides a unique method for observing and chemically identifying single atoms on solid surfaces. Recent advances in the method,which are largely due to the present authors, now permit the atomic-scale chemistry of a solid specimen to be recognised in three dimensions. As a result of these developments, new and exciting applications are rapidly emerging in the field of material science, surface science, and catalysis. The book is a state-of-the art account of this important field, and is intended for a graduate-level readership.

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